Fourier analysis-based automatic test pattern generation for combinational circuits

Ayav, TolgaAyav, TolgaBilgisayar Mühendisliği Bölümü2024-08-202024-08-202015097814673738692165-0608[WOS-DOI-BELIRLENECEK-2]https://premium.gcris.co/handle/123456789/79Ayav, Tolga/0000-0003-1426-5694Fourier analysis of boolean functions has attracted great attention from computer scientists in the last decade but it still has few application areas. This work presents a Fourier analysis-based automatic test pattern generation method for combinational circuits.trinfo:eu-repo/semantics/closedAccessCombinational circuitFourier analysisWalsh transformationautomatic test pattern generationFourier analysis-based automatic test pattern generation for combinational circuitstext::conference output::conference proceedings::conference paper