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Browsing WOS by Subject "automatic test pattern generation"

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    Conference Paper
    Fourier analysis-based automatic test pattern generation for combinational circuits
    (Ieee, 2015) Ayav, Tolga; Ayav, Tolga; Bilgisayar Mühendisliği Bölümü
    Fourier analysis of boolean functions has attracted great attention from computer scientists in the last decade but it still has few application areas. This work presents a Fourier analysis-based automatic test pattern generation method for combinational circuits.